The 20th IFIP Int. Conference on Testing of Communicating Systems (TESTCOM) and the 8th Int. Workshop on Formal Approaches to Testing of Software (FATES) will be conducted jointly as TESTCOM/FATES CONFERENCE

Call for Papers

PDF Version

Campus Innovation Center, Tokyo, Japan, June 10-13, 2008
Co-located with FORTE'08
http://www-higashi.ist.osaka-u.ac.jp/FORTE08/

IFIP TESTCOM and FATES will be conducted jointly in Tokyo in the Summer of 2008. Bringing together the communities of these two established testing events promises to become a major testing event of 2008. We cordially invite you to submit testing related papers and join us in Tokyo.

Scope and Objective


Testing is one of the most important techniques for validating and checking the correctness of communication and software systems. Testing, however, is also a laborious and very cost-intensive task during the development process of such systems. TESTCOM is a series of international conferences addressing the problems of testing communicating systems, including communication protocols, services, distributed platforms, and middleware. FATES is a series of international workshops discussing the challenges of using rigorous and formal methods for testing software systems, such as communication, control, embedded, administrative, and web-based software.

TESTCOM/FATES'08 aims at being a forum for researchers, developers, testers, and users to review, discuss, and learn about new approaches, concepts, theories, methodologies, tools, and experiences in the field of testing of communicating systems and software.

Topics of interest
  • Aspects of testing: test derivation, test selection, test coverage, test im-plementation and execution, test result analysis, test oracles, test man-agement, monitoring and runtime verification, test frameworks
  • Model-based testing: formal models and modeling languages such as automata, state machines, process algebra, logics, SDL, UML, Markov-chains, test generation from models, model coverage
  • Kinds of testing: functional, interoperability, performance, conformance, security, reliability, robustness, etc.
  • Application areas: communicating systems such as protocols, middleware, networks, web services, wireless applications, control systems, business information systems, embedded and real-time software, etc.
  • Combinations of different testing techniques and combinations with other validation techniques, e.g. combined verification and testing
  • Tools to support any of the testing activities
  • Case studies and industrial applications of testing methodologies and test tools
Types of contributions

Different kinds of contributions are solicited for TESTCOM/FATES'08:

  • Theory-oriented research full papers (max. 16 pages) describing results of theoretical or experimental research, which must be original, significant, and sound
  • Application-oriented research full papers (max. 16 pages) describing results of the application of new testing methodologies or focusing on empirical studies or the industrial transfer, which should be significant and provide sufficient data to assess the experiment or application
  • Industrial best practice papers (2 pages of extended abstract plus max. 24 slides after acceptance) describing approaches and means to introduce new testing methodologies in an industrial context that are beneficial and can be adopted by other organizations
  • Work-in-progress papers (max. 5 pages) describing very recent research activities and preliminary results that are worth discussing
  • Tutorial proposals (3 pages) within the scope of the conference
Submissions

All contributions to TESTCOM/FATES'08 have to be submitted electronically in PDF format via the conference website. All submissions have to follow the Springer LNCS paper format; see http://www.springer.de/comp/lncs/authors.html.
All full paper submissions are thoroughly reviewed by the Program Committee. Submissions to industrial best practices and other short papers undergo a lightweight reviewing process. Tutorial proposals are selected based on the expected benefit for the conference attendees.
The submission type according to the categories mentioned under Types of Contributions must be stated explicitly by the author(s) upon submission via the conference website. The submission type influences the review criteria.
To submit an industrial best practice paper it is required to prepare an extended abstract of the intended presentation that clearly demonstrates the benefits of the chosen approach or method and gives indications how the approach or method can be re-used by other organizations. After the notification of acceptance the author(s) of an accepted industrial best practice paper prepare at most 24 slides of their intended presentation and submit them (2 slides per page; PDF format) together with their revised extended abstract for publication.
Tutorial proposals shall be sent directly to the program committee co-chairs.
Accepted contributions must be presented at the conference. Accepted full papers are published by Springer in the LNCS series. Authors need to sign a copyright transfer form to transfer usage rights on their papers to Springer. Other accepted contributions are published in an internal proceedings volume.

Important dates

Research full papers:

January 4 January 14, 23:59 PST, 2008 Abstract submission (firm!)
January 11 January 21, 23:59 PST, 2008 Full paper submission (firm!)
February 29 March 4, 2008 Notification of acceptance
March 14 March 18, 2008 Camera-ready version

Industrial best practice, work-in-progress, tutorial proposals:

March 21March 31, 2008 Short paper submission
April 11 April 18, 2008 Notification of acceptance
May 2, 2008 Submission of the final version
TESTCOM/FATES/FORTE General Co-Chairs

Kenji Suzuki, University of Electro-Communications, Japan
Teruo Higashino, Osaka University, Japan

TESTCOM Steering Committee

John Derrick, Chairman, U of Sheffield, UK
Ana R. Cavalli, INT, France
Roland Groz, Grenoble Institute of Technology, France
Alexandre Petrenko, CRIM, Canada

TESTCOM/FATES Program Committee Co-Chairs

Andreas Ulrich, Siemens AG, Germany
Toru Hasegawa, KDDI R&D Labs., Japan

Program Committee

Bernhard K. Aichernig, TU Graz, Austria
Antonia Bertolino, ISTI-CNR, Italy
Gregor v. Bochmann, U of Ottawa, Canada
Richard Castanet, LABRI, France
Shing Chi Cheung, Hong Kong U of Science and Technology, China
Sarolta Dibuz, Ericsson, Hungary
Rachida Dssouli, Concordia U, Canada
Khaled El-Fakih, American U of Sharjah, UAE
Marie-Claude Gaudel, U of Paris-Sud, France
Jens Grabowski, U of Göttingen, Germany
Rob Hierons, Brunel U, UK
Dieter Hogrefe, U of Göttingen, Germany
Antti Huima, Conformiq Software Ltd., Finland
Thierry Jéron, IRISA Rennes, France
Ferhat Khendek, Concordia U, Canada
Myungchul Kim, ICU, Korea
Yoshihi Kinoshita, AIST, Japan
Hartmut König, BTU Cottbus, Germany
Victor V. Kuliamin, ISP RAS, Russia
David Lee, Ohio State U, USA
Bruno Legeard, Leirios, France
Giulio Maggiore, Telecom Italia Mobile, Italy
José Carlos Maldonado, U of San Carlos, Brazil
Brian Nielsen, U of Aalborg, Denmark
Manuel Núñez, UC de Madrid, Spain
Tomohiko Ogishi, KDDI R&D Labs., Japan
Ian Oliver, Nokia Research, Finland
Doron Peled, U of Bar-Ilan, Israel
Fumiaki Sato, Toho University, Japan
Ina Schieferdecker, Fraunhofer FOKUS, Germany
Jan Tretmans, Embedded Systems Institute, The Netherlands
Hasan Ural, U of Ottawa, Canada
Mark Utting, U of Waikato, New Zealand
M. Ümit Uyar, City U of New York, USA
Margus Veanes, Microsoft Research, USA
César Viho, IRISA Rennes, France
Carsten Weise, RWTH Aachen, Germany
Colin Willcock, Nokia Siemens Network, Germany
Burkhart Wolff, ETH Zurich, Switzerland
Nina Yevtushenko, Tomsk State U, Russia

Local Organization

Tomohiko Ogishi, KDDI R&D Labs. (Chair)
Takaaki Umedu, Osaka University

Venue

TESTCOM/FATES'08 will take place at the Campus Innovation Center in Tokyo, the capital of Japan; see http://www-higashi.ist.osaka-u.ac.jp/TESTCOM-FATES08/access.html. The conference is co-located with FORTE'08, the 27th IFIP Int. Conference on Formal Techniques for Networked and Distributed Systems. Participants registered to one of these conferences may freely attend the technical sessions of the other; see http://www-higashi.ist.osaka-u.ac.jp/FORTE08/

Further Information

For further information visit the TESTCOM/FATES'08 website
http://www-higashi.ist.osaka-u.ac.jp/TESTCOM-FATES08/
.
Or contact the program committee co-chairs by sending an e-mail to
testcom-fates2008[at]hsc.kddilabs.jp